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＜電子ブック＞
Linear Models for Optimal Test Design / by Wim J. van der Linden
(Statistics for Social and Behavioral Sciences. ISSN:21997365)

版	1st ed. 2005.
出版者	(New York, NY : Springer New York : Imprint: Springer)
出版年	2005
本文言語	英語
大きさ	XXIV, 408 p. 44 illus : online resource
著者標目	*van der Linden, Wim J author SpringerLink (Online service)
件　名	LCSH:Social sciences -- Statistical methods  全ての件名で検索 LCSH:Educational tests and measurements LCSH:Psychometrics FREE:Statistics in Social Sciences, Humanities, Law, Education, Behavorial Sciences, Public Policy FREE:Assessment and Testing FREE:Psychometrics
一般注記	Brief History of Test Theory and Design -- Formulating Test Specifications -- Modeling Test-Assembly Problems -- Solving Test-Assembly Problems -- Models for Assembling Single Tests -- Models for Assembling Multiple Tests -- Models for Assembling Tests with Item Sets -- Models for Assembling Tests Measuring Multiple Abilities -- Models for Adaptive Test Assembly -- Designing Item Pools for Programs with Fixed Tests -- Designing Item Pools for Programs with Adaptive Tests -- Epilogue This book begins with a reflection on the history of test design--the core activity of all educational and psychological testing. It then presents a standard language for modeling test design problems as instances of multi-objective constrained optimization. The main portion of the book discusses test design models for a large variety of problems from the daily practice of testing, and illustrates their use with the help of numerous empirical examples. The presentation includes models for the assembly of tests to an absolute or relative target for their information functions, classical test assembly, test equating problems, item matching, test splitting, simultaneous assembly of multiple tests, tests with item sets, multidimensional tests, and adaptive test assembly. Two separate chapters are devoted to the questions of how to design item banks for optimal support of programs with fixed and adaptive tests. Linear Models for Optimal Test Design, which does not require any specific mathematical background, has been written to be a helpful resource on the desk of any test specialist. Wim J. van der Linden is Professor of Measurement and Data Analysis, University of Twente, The Netherlands. His specialization is psychometric theory and methods, and he has been an active researcher of item response theory throughout his career. His current research is on test design, adaptive testing, test equating, and response-time modeling. Professor van der Linden is a past president of the Psychometric Society and a recipient of the NCME lifetime achievement award for his work on educational measurement HTTP:URL=https://doi.org/10.1007/0-387-29054-0

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