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＜図書＞
Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant
(Wiley series in probability and mathematical statistics)

版	3rd ed
出版者	Hoboken, N.J. : Wiley
出版年	c2013
本文言語	英語
大きさ	xvi, 500 p. : ill. ; 25 cm
著者標目	*Hosmer, David W. Lemeshow, Stanley Sturdivant, Rodney X.
件　名	LCSH:Regression analysis
一般注記	Series statement on cover: Wiley series in probability and statistics Includes bibliographical references (p. 459-478) and index

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