<Books>
Statistical methods for the reliability of repairable systems / Steven E. Rigdon, Asit P. Basu
(Wiley series in probability and mathematical statistics ; . Applied probability and statistics section)
Publisher | New York : Wiley |
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Year | c2000 |
Language | English |
Size | xii, 281 p. : ill. ; 25 cm |
Authors | *Rigdon, Steven E., 1955- Basu, Asit P. |
Subjects | LCSH:Reliability (Engineering) -- Statistical methods
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LCSH:Maintainability -- Statistical methods All Subject Search |
Notes | "Wiley-Interscience publication" Includes bibliographical references (p. 267-275) and index |
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Location | Media type | Volume | Call No. | Status | Reserve | Comments | ISBN | Printed | Restriction | Designated Book | Barcode No. |
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数学図書室(図書) | 図書 |
|
417//R39 |
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0471349410 |
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|
9200006522 |
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Material Type | Books |
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Classification | NDC9:509.6 LCC:TA169.B38 DC21:620/.00452 |
ID | 6000001702 |
ISBN | 0471349410 |
NCID | BA4687324X |
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