＜Books＞
Statistical methods for the reliability of repairable systems / Steven E. Rigdon, Asit P. Basu
(Wiley series in probability and mathematical statistics ; . Applied probability and statistics section)
| Publisher | New York : Wiley |
|---|---|
| Year | c2000 |
| Language | English |
| Size | xii, 281 p. : ill. ; 25 cm |
| Authors | *Rigdon, Steven E., 1955- Basu, Asit P. |
| Subjects | LCSH:Reliability (Engineering) -- Statistical methods
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LCSH:Maintainability -- Statistical methods All Subject Search |
| Notes | "Wiley-Interscience publication" Includes bibliographical references (p. 267-275) and index |
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| Location | Media type | Volume | Call No. | Status | Reserve | Comments | ISBN | Printed | Restriction | Designated Book | Barcode No. |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 数学図書室(図書) | 図書 |
|
417//R39 |
|
0471349410 |
|
|
|
9200006522 |
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| Material Type | Books |
|---|---|
| Classification | NDC9:509.6 LCC:TA169.B38 DC21:620/.00452 |
| ID | 6000001702 |
| ISBN | 0471349410 |
| NCID | BA4687324X |
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