＜Books＞
Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant
(Wiley series in probability and mathematical statistics)
| Edition | 3rd ed |
|---|---|
| Publisher | Hoboken, N.J. : Wiley |
| Year | c2013 |
| Language | English |
| Size | xvi, 500 p. : ill. ; 25 cm |
| Authors | *Hosmer, David W. Lemeshow, Stanley Sturdivant, Rodney X. |
| Subjects | LCSH:Regression analysis |
| Notes | Series statement on cover: Wiley series in probability and statistics Includes bibliographical references (p. 459-478) and index |
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| Location | Media type | Volume | Call No. | Status | Reserve | Comments | ISBN | Printed | Restriction | Designated Book | Barcode No. |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 数学図書室(図書) | 図書 | : [hardcover] | 417//H92 |
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9780470582473 |
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5201530581 |
Hide details.
| Material Type | Books |
|---|---|
| Classification | DC23:519.536 |
| ID | 2000108775 |
| ISBN | 9780470582473 |
| NCID | BB12413927 |
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