<Books>
Contamination control in trace element analysis / Morris Zief, James W. Mitchell
(Chemical analysis ; v. 47)
Publisher | New York : Wiley |
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Year | c1976 |
Language | English |
Size | xiv, 262 p. : ill. ; 24 cm |
Authors | *Zief, Morris Mitchell, James W. joint author |
Subjects | LCSH:Trace elements -- Analysis
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LCSH:Contamination (Technology) |
Notes | "A Wiley-Interscience publication." Includes bibliographical references and index |
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Hide book details.
Location | Media type | Volume | Call No. | Status | Reserve | Comments | ISBN | Printed | Restriction | Designated Book | Barcode No. |
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書庫M4F 自然系継続図書 | 図書 |
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433//C38//47 |
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0471611697 | 1976 |
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2016094372 |
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