＜Books＞
Contamination control in trace element analysis / Morris Zief, James W. Mitchell
(Chemical analysis ; v. 47)
| Publisher | New York : Wiley |
|---|---|
| Year | c1976 |
| Language | English |
| Size | xiv, 262 p. : ill. ; 24 cm |
| Authors | *Zief, Morris Mitchell, James W. joint author |
| Subjects | LCSH:Trace elements -- Analysis
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LCSH:Contamination (Technology) |
| Notes | "A Wiley-Interscience publication." Includes bibliographical references and index |
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Hide book details.
| Location | Media type | Volume | Call No. | Status | Reserve | Comments | ISBN | Printed | Restriction | Designated Book | Barcode No. |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 書庫M4F 自然系継続図書 | 図書 |
|
433//C38//47 |
|
0471611697 | 1976 |
|
|
2016094372 |
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