＜Books＞
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner
(Chemical analysis : a series of monographs on analytical chemistry and its applications ; v. 86)
| Publisher | New York : John Wiley & Sons |
|---|---|
| Year | c1987 |
| Language | English |
| Size | xxxv, 1227 p. : ill. ; 24 cm |
| Authors | *Benninghoven, A. Rüdenauer, F. G. Werner, H. W. |
| Subjects | LCSH:Secondary ion mass spectrometry |
| Notes | "A Wiley-Interscience publication." Bibliography: p. 1125-1216 Includes index |
TOC
Hide book details.
| Location | Media type | Volume | Call No. | Status | Reserve | Comments | ISBN | Printed | Restriction | Designated Book | Barcode No. |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 書庫M4F 自然系継続図書 | 図書 | v. 86 | 433//C38//86 |
|
0471010561 | 1987 |
|
|
0086102925 |
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