＜Books＞
Pattern recognition and machine learning; proceedings / Edited by K. S. Fu.
| Publisher | New York : Plenum Press |
|---|---|
| Year | 1971 |
| Size | ix, 343 p. illus. 26 cm. |
| Authors | Japan-U.S. Seminar on the Learning Process in Control Systems (1970 : Nagoya, Japan) Fu, K. S. (King Sun), 1930- |
| Subjects | Pattern recognition systems Self-organizing systems -- Congresses All Subject Search Machine learning |
| Notes | Includes bibliographical references. |
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Hide book details.
| Location | Media type | Volume | Call No. | Status | Reserve | Comments | ISBN | Printed | Restriction | Designated Book | Barcode No. |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 数学図書室(図書) | 図書 |
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410.6//P27//X3-'70 |
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0306305461 |
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2013057325 |
Hide details.
| Material Type | Books |
|---|---|
| Classification | DC:001.533 |
| ID | 1000050493 |
| ISBN | 0306305461 |
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